X-ray topography of Ca0.5Sr0.5NdAlO4 single crystal

X-ray topography of subsurface crystal layers1

New capabilities of the Berg–Barrett topographic method are demonstrated using a skew-asymmetric X-ray diffraction scheme for investigating structural changes near the surface of semiconductor materials. Specifying the X-ray extinction depth, the details of defects and strains are revealed with high resolution. Consequently, analysis of structural distortion of layers near the surface after var...

Live X-Ray Topography and Crystal Growth of Silicon

Single Crystal Diamond X-ray Lens Development

The next generation light sources such as diffractionlimited storage rings and high repetition rate free electron lasers (FELs) will generate x-ray beams with significantly increased peak and average brilliance. These future facilities will require x-ray optical components capable of handling large instantaneous and average power densities while tailoring the properties of the x-ray beams for a...

X-Ray Topography

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Redetermination of Dy3Ni from single-crystal X-ray data

The classification of the title compound, tridysprosium nickel, into the Fe3C (or Al3Ni) structure type has been deduced from powder X-ray diffraction data with lattice parameters reported in a previous study [Lemaire & Paccard (1967 ▶). Bull. Soc. Fr. Mineral. Cristallogr. 40, 311-315]. The current re-investigation of Dy3Ni based on single-crystal X-ray data revealed atomic positional paramete...